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形貌分析

冷场发射扫描电子显微镜测试(S4800)选项
热场发射扫描电子显微镜分析选项
扫描电子显微镜(搭载EBSD探头)
球差校正透射电镜
蔡司MERLIN Compact超高分辨场发射扫描电镜

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合金高分辨场发射透射电镜(TEM)
FEI TECNAI G2 F20

¥600.00

蔡司超高分辨场发射扫描电镜
蔡司MERLIN Compact

¥150.00

冷冻电镜(Cryo-EM)
FEI Titan Krios

¥30,000.00

球差校正透射电镜测试(磁性)—自营
日本电子JEM-ARM200F

¥3,500.00

全自动压汞仪(MIP)
AutoPore IV 9510

¥800.00

热场发射高分辨扫描电镜(SEM)
德国蔡司SUPRA55

¥150.00

原位双球差校正透射电镜
FEI Titan ETEM

¥20,000.00